 Equipment Failure Analysis
"Equipment Failure Analysis" is a descriptor in the National Library of Medicine's controlled vocabulary thesaurus,
MeSH (Medical Subject Headings). Descriptors are arranged in a hierarchical structure,
which enables searching at various levels of specificity.
The evaluation of incidents involving the loss of function of a device. These evaluations are used for a variety of purposes such as to determine the failure rates, the causes of failures, costs of failures, and the reliability and maintainability of devices.
| Descriptor ID |
D019544
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| MeSH Number(s) |
E05.325.192
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| Concept/Terms |
Equipment Failure Analysis- Equipment Failure Analysis
- Analysis, Equipment Failure
- Analyses, Equipment Failure
- Equipment Failure Analyses
- Failure Analyses, Equipment
- Failure Analysis, Equipment
Prosthesis Failure Analysis- Prosthesis Failure Analysis
- Analysis, Prosthesis Failure
- Analyses, Prosthesis Failure
- Failure Analyses, Prosthesis
- Failure Analysis, Prosthesis
- Prosthesis Failure Analyses
Materials Failure Analysis- Materials Failure Analysis
- Analysis, Materials Failure
- Analyses, Materials Failure
- Failure Analyses, Materials
- Failure Analysis, Materials
- Materials Failure Analyses
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Below are MeSH descriptors whose meaning is more general than "Equipment Failure Analysis".
Below are MeSH descriptors whose meaning is more specific than "Equipment Failure Analysis".
This graph shows the total number of publications written about "Equipment Failure Analysis" by people in this website by year, and whether "Equipment Failure Analysis" was a major or minor topic of these publications.
To see the data from this visualization as text, click here.
| Year | Major Topic | Minor Topic | Total |
|---|
| 2003 | 0 | 1 | 1 | | 2004 | 0 | 5 | 5 | | 2005 | 0 | 1 | 1 | | 2006 | 0 | 2 | 2 | | 2008 | 0 | 4 | 4 | | 2009 | 1 | 8 | 9 | | 2010 | 0 | 4 | 4 | | 2011 | 0 | 3 | 3 | | 2012 | 0 | 6 | 6 | | 2013 | 0 | 2 | 2 | | 2014 | 0 | 1 | 1 | | 2015 | 0 | 1 | 1 |
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Below are the most recent publications written about "Equipment Failure Analysis" by people in Profiles.
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Avci NG, Fan Y, Dragomir A, Akay YM, Akay M. Investigating the Influence of HUVECs in the Formation of Glioblastoma Spheroids in High-Throughput Three-Dimensional Microwells. IEEE Trans Nanobioscience. 2015 Oct; 14(7):790-6.
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Park S, Yang G, Madduri N, Abidian MR, Majd S. Hydrogel-mediated direct patterning of conducting polymer films with multiple surface chemistries. Adv Mater. 2014 May; 26(18):2782-7.
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van Dijk T, Mayerich D, Bhargava R, Carney PS. Rapid spectral-domain localization. Opt Express. 2013 May 20; 21(10):12822-30.
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Dimit R, Gire A, Pflugfelder SC, Bergmanson JP. Patient ocular conditions and clinical outcomes using a PROSE scleral device. Cont Lens Anterior Eye. 2013 Aug; 36(4):159-63.
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Wang S, Li J, Manapuram RK, Menodiado FM, Ingram DR, Twa MD, Lazar AJ, Lev DC, Pollock RE, Larin KV. Noncontact measurement of elasticity for the detection of soft-tissue tumors using phase-sensitive optical coherence tomography combined with a focused air-puff system. Opt Lett. 2012 Dec 15; 37(24):5184-6.
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De D, Manongdo J, See S, Zhang V, Guloy A, Peng H. High on/off ratio field effect transistors based on exfoliated crystalline SnS2 nano-membranes. Nanotechnology. 2013 Jan 18; 24(2):025202.
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Jiang R, Jansen BH, Sheth BR, Chen J. Dynamic multi-channel TMS with reconfigurable coil. IEEE Trans Neural Syst Rehabil Eng. 2013 May; 21(3):370-5.
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Larina IV, Syed SH, Sudheendran N, Overbeek PA, Dickinson ME, Larin KV. Optical coherence tomography for live phenotypic analysis of embryonic ocular structures in mouse models. J Biomed Opt. 2012 Aug; 17(8):081410-1.
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Chang LV, Nasruallah A, Ruchhoeft P, Khizroev S, Litvinov D. Graded bit patterned magnetic arrays fabricated via angled low-energy He ion irradiation. Nanotechnology. 2012 Jul 11; 23(27):275705.
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Mavrokefalos A, Han SE, Yerci S, Branham MS, Chen G. Efficient light trapping in inverted nanopyramid thin crystalline silicon membranes for solar cell applications. Nano Lett. 2012 Jun 13; 12(6):2792-6.
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